Structural characterization of highly strained InAs N monolayer lasers and quantum well structures by X-ray diffraction and transmission electron microscopy

  1. Mazuelas, A.
  2. Molina, S.I.
  3. Aragón, G.
  4. Meléndez, J.
  5. Dotor, M.L.
  6. Huertas, P.
  7. Briones, F.
Zeitschrift:
Journal of Crystal Growth

ISSN: 0022-0248

Datum der Publikation: 1993

Ausgabe: 127

Nummer: 1-4

Seiten: 596-600

Art: Artikel

DOI: 10.1016/0022-0248(93)90691-O GOOGLE SCHOLAR