Transmission electron microscopy study of InxGa1-xAs/GaAs multilayer buffer structures used as dislocation filters

  1. González, D.
  2. Araújo, D.
  3. Sacedón, A.
  4. Calleja, E.
  5. Molina, S.I.
  6. Aragón, G.
  7. García, R.
Aldizkaria:
Materials Science and Engineering B

ISSN: 0921-5107

Argitalpen urtea: 1994

Alea: 28

Zenbakia: 1-3

Orrialdeak: 515-519

Mota: Artikulua

DOI: 10.1016/0921-5107(94)90118-X GOOGLE SCHOLAR
Datuen iturria: Scopus