Transmission electron microscopy study of InxGa1-xAs/GaAs multilayer buffer structures used as dislocation filters

  1. González, D.
  2. Araújo, D.
  3. Sacedón, A.
  4. Calleja, E.
  5. Molina, S.I.
  6. Aragón, G.
  7. García, R.
Revue:
Materials Science and Engineering B

ISSN: 0921-5107

Année de publication: 1994

Volumen: 28

Número: 1-3

Pages: 515-519

Type: Article

DOI: 10.1016/0921-5107(94)90118-X GOOGLE SCHOLAR
La source de données: Scopus