Reordering of the ridge patterns of a stochastic electromagnetic field by diffraction due to an ideal slit

  1. Avendaño, J.
  2. De La Peña, L.
Zeitschrift:
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

ISSN: 1539-3755,  1550-2376

Datum der Publikation: 2005

Ausgabe: 72

Nummer: 6

Art: Artikel

DOI: 10.1103/PHYSREVE.72.066605 GOOGLE SCHOLAR
Datenquelle: Scopus