Reordering of the ridge patterns of a stochastic electromagnetic field by diffraction due to an ideal slit

  1. Avendaño, J.
  2. De La Peña, L.
Revue:
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

ISSN: 1539-3755,  1550-2376

Année de publication: 2005

Volumen: 72

Número: 6

Type: Article

DOI: 10.1103/PHYSREVE.72.066605 GOOGLE SCHOLAR
La source de données: Scopus